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400nm-Wide-Spike @ 6µm
ZEISS and TESCAN systems
electrostatic force microscopy (EFM)
Width x Thickness 53011 Tweezer
Multi75-G All 400nm-Wide-Spike @ 6µmStandard Force Modulation AFM Probe DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Standard Force Modulation AFM Probe Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM) operation. The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is industry standard
